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SSD, TRIM and IOMeter
by Marc Prieur
Published on June 22, 2010



Over the last two years, SSDs have become increasingly accessible. Although full roll out into our machines has been slowed somewhat by the price of MLC, SSDs have brought staggering improvements to the speed of PC storage systems.


At a time when new controllers are coming onto the market, we wanted to take a look at where things are in terms of SSD fragmentation, TRIM and how it has been implemented in Windows 7, as well as in IOMeter, the powerful synthetic testing software which can however be misused when it comes to testing SSDs.
Back to the future
Since September 2008 we have published seven articles on SSDs:

- SSD Product Review: Intel, OCZ, Samsung, Silicon Power, SuperTalent - October 6, 2008
- Mtron MOBI 3500 - December 18, 2008
- Samsung 64 GB MLC SSD - December 29, 2008
- SSD 2009, act 1: OCZ Apex and Samsung PB22-J - April 27, 2009
- SSD 2009, act 2: OCZ Vertex and Indilinx Barefoot - June 23, 2009
- Intel X25-M, round 2: 10 SSDs compared - August 27, 2009
- Intel X25-M V2 (Postville) - August 27, 2009

From the start, we drew attention to a phenomenon that is more or less significant depending on the model, which translates to a deterioration in performance over the course of use of the SSD. The TRIM command, implemented in Windows 7 since its release, was very much anticipated as a solution to this issue. What happened when we put it to the test? True, we’ve been a little bit slow off the mark, but we have taken the opportunity to revisit our SSD protocol as well as look at the impact of TRIM on test software such as IOMeter.


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